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本文讨论了X射线探伤在高频大功率晶体管热性能分析中的应用。通过实验证明,在大功率器件的管壳结构设计及工艺质量,管芯片烧结等方面,X射线探伤是一种科学而简单的检查方法。
This article discusses the application of X-ray inspection in thermal analysis of high-frequency, high-power transistors. The experiment proves that X-ray inspection is a scientific and simple inspection method in the design of shell structure and process quality of high-power devices and tube chip sintering.