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电阻阵列是一种出射式动态红外场景投射器件,它通过控制流经电阻元的电流使电阻发热产生红外辐射,达到成像目的。由于非均匀性校正等需求,需要使用红外成像探测器测试单个电阻元的辐射特性。由于输入电流和输出红外辐射之间复杂的非线性关系,电阻阵列的辐射输出特性主要通过测试数据拟合来获取。基于典型的光学系统配置,给出了电阻元辐射亮度与探测器辐射照度之间的关系式,分析了光轴上及轴外电阻元辐射亮度的测试方法;通过对硅桥和悬浮薄膜电阻阵列电阻元的分析,给出了实际温度与等效黑体温度之间的对应关系,对电阻阵列辐射输出特性的测试具有一定的理论参考价值。
The resistor array is an exit-type dynamic infrared scene projection device that generates infrared radiation by controlling the resistance of the current flowing through the resistance element to achieve imaging. Due to non-uniformity correction and other needs, the need to use infrared imaging detector to test the radiation characteristics of a single resistance element. Due to the complex non-linear relationship between the input current and the output IR radiation, the radiation output characteristics of the resistor array are mainly obtained by fitting the test data. Based on the typical optical system configuration, the relationship between the radiation intensity of the resistance element and the radiation irradiance of the detector is given. The test method of the radiation brightness of the resistance element on the optical axis and the on-axis is analyzed. The analysis of the resistance element gives the correspondence between the actual temperature and the equivalent black body temperature, and has certain theoretical reference value for the test of the radiation output characteristics of the resistance array.