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The exchange bias field of NiFe/FeMn films with Ta/ Cu buffer was proved to be lower than that of the films with Ta buffer. The crystallographic texture, surface roughness and elements distribution were examined in these two sets of samples, and there is no apparent difference for the texture and roughness. However, the segregation of Cu atoms above NiFe surface in the multilayer of Ta/Cu/NiFe has been observed by using the angle-resolved X-ray photoelectron spectroscopy (XPS). The decrease of the exchange bias field for NiFe/FeMn films with Ta/ Cu buffer layers is mainly caused by the Cu atoms segregation at the interface between NiFe and FeMn.
The exchange bias field of NiFe / FeMn films with Ta / Cu buffer was proved to be lower than that of the films with Ta buffer. The crystallographic texture, surface roughness and elements distribution were examined in these two sets of samples, and there is no However, the segregation of Cu atoms above NiFe surface in the multilayer of Ta / Cu / NiFe has been observed by using the angle-resolved X-ray photoelectron spectroscopy (XPS). The decrease of the exchange bias field for NiFe / FeMn films with Ta / Cu buffer layers is mainly caused by the Cu atoms segregation at the interface between NiFe and FeMn.