随着集成电路的迅速发展和广泛应用,很多以往由分立元件装制的一块一块印刷电路板组成的电子部件,只要用一块或几块集成电路便可替代。因而原来的电子部件装配过程中大量的调试任务便改由集成电路的设计者和制造者承担起来;并且很自然地集成电路本身也走向标准化和通用化。于是,如何有效而又迅速地对集成电路测试就成为集成电路制造者和使用者的一个迫切问题。从国内外情况来看,在集成电路发展初期,集成电路测试器的制造是从属于集成电路生产部门的,多为专用机(即一种测试器只能测试一个或几个特定的品种)。随着集成电路进一步发展和更广泛应用,就要求测试器通用化并且成为一个独立的研制部门。由于集成电路品种多样、内部结构较复杂、功能变化多、管脚也多,因此与晶体管测试器相比,通用集成电路测试器 With the rapid development and widespread application of integrated circuits, many electronic components consisting of one printed circuit board assembled by discrete components in the past can be replaced by one or more integrated circuits. Therefore, a large number of debugging tasks of the original electronic components assembly process have been changed by the designers and manufacturers of integrated circuits. Naturally, the integrated circuits themselves have also been standardized and generalized. Therefore, how to test integrated circuits effectively and rapidly has become an urgent problem for integrated circuit manufacturers and users. Judging from the situation at home and abroad, in the early stage of the development of integrated circuits, the manufacture of integrated circuit testers was subordinate to the integrated circuit manufacturing department, mostly dedicated machines (that is, a tester can only test one or several specific varieties). As integrated circuits continue to evolve and become more widely used, testers are required to be universal and an independent development unit. As a variety of integrated circuits, the internal structure of more complex, multi-functional changes, and more pins, so compared with the transistor tester, General Purpose Integrated Circuit Tester