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系统地研究金属玻璃的结构弛豫和晶化过程对研究这些材料的热稳性十分重要,一般采用传统的透射电子显微技术、X射线衍射、示差扫描卡计(DSC)和电阻测量等技术。这些方法各有特点和优越性,但也有它们的局限性,往往不能直接反映在加热过程中微区的结构变化和局部成份变化之间的关系。俄歇谱仪是研究试样表面层成份的重要工具,有较高的灵敏度。我们用俄歇谱仪原位加热的分析技术,初步看到了在Pd_(80)Si_(20)加玻璃态合金结构弛豫和晶化的同时,试样表面的成份在局部区域有明显的、规律性的变化。
The systematic study of the structural relaxation and crystallization processes of metallic glass is very important for studying the thermal stability of these materials. Conventional techniques such as transmission electron microscopy, X-ray diffraction, differential scanning calorimetry (DSC) and resistance measurement . These methods have their own characteristics and advantages, but also have their limitations. They often can not directly reflect the relationship between the structural changes of micro-regions and the changes of local components during the heating process. Auger spectroscopy is an important tool for studying the composition of the sample surface layer, with high sensitivity. Using the analysis technique of in-situ heating by Auger spectrometer, we can see that the composition of the sample surface is obvious in the local area while the relaxation and crystallization of the glassy alloy Pd_ (80) Si_ (20) Regular changes.