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本文介绍了一种简便的从200兆赫至1000兆赫之间晶体管最高振盪频率的测量方法,同时分析了测量误差与振盪电路品质因素Q,特性阻抗ρ,及反馈电容C_0的关系。
This paper presents a simple method for measuring the maximum oscillation frequency of a transistor from 200 MHz to 1000 MHz and analyzes the relationship between the measurement error and the Q factor of the oscillator circuit, the characteristic impedance ρ, and the feedback capacitor C_0.