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3CCM型硅磁敏三极管长期贮存寿命试验和加热老化试验表明,它的零场集电极电流相对时漂概率分布极值在1％以内,且时漂概率分布与老化时间呈对数关系。
The long-term storage life test and heating aging test of 3CCM silicon magnetosensitive triode show that the extreme value of its zero-field collector current relative drift probability distribution is within 1%, and the time drift probability distribution is logarithmically related to the aging time.