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本文提出一种新的测试方案:将一个透镜或偏置反射面放在被测反射面天线的前面,测得透镜或偏置反射面焦平面上的电场分布图,重新标度,便成为被测天线的方向图。这种方向图测试方法的主要优点足只需近场振幅数据,而不需要相位数据,比其他测试方案简单、精确。
In this paper, a new test scheme is proposed: a lens or bias reflective surface is placed in front of the antenna of the reflector to be measured, and the electric field distribution on the focal plane of the lens or the offset reflector is measured and rescaled. Test the antenna pattern. The main advantage of this method of pattern testing is that it requires only near-field amplitude data without the need for phase data and is simple and accurate over other test solutions.