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表征器件单粒子敏感度的σ-LET 曲线是轨道翻转率预估的重要依据.利用兰州重离子加速器（HIRFL）加速的 35 MeV/u的36Ar离子和 15.14 MeV/u的136Xe离子得到的 32 kbit×8静态存储器（SRAM）IDT71256单粒子翻转的实验数据,用Weibull和Lognormal两种函数拟合获得了完整的σ-LET 曲线,对两种拟合结果的差别进行了讨论,并在拟合参数的基础上估算了地球同步轨道和两条太阳同步轨道辐射环境中IDT71256的翻转率.
The σ-LET curve characterizing the single-particle sensitivity of the device is an important basis for the prediction of the orbital turnover rate.The 32 kbit (32 kbit) data obtained from 36 Me ions accelerated at 15 MeV / u and 136 Xe ions accelerated at 15.14 MeV / × 8 static memory (SRAM) IDT71256 experimental data of single-particle flip, using Weibull and Lognormal two-function fitting to obtain a complete sigma-LET curve, the difference between the two fitting results were discussed and the fitting parameters Based on the estimated geosynchronous orbit and two sun synchronous orbit radiation environment IDT71256 flip rate.