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用X射线荧光光谱法测定试样的主要成分时,主要是用数学校正法来校正基体成分对分析结果的影响,然而用数学校正法来分析试样中的低、微量元素是很困难的.分析试样中的低、微量元素,多数作者是采用散射内标法或加人内标法来校正基体效应.用散射内标法测定试样中的低、微量元素时,背景强度的变化往往影响分析结果的精确度,特别是分析元素靠近检出限时,分析元素能否检出以及测定结果的精确度如何,主要取决于背景强度的大小及背景测定的精确度.
X-ray fluorescence spectrometry for the determination of the main components of the sample, the main method is to use mathematical correction to correct the matrix composition of the analysis results, but using mathematical correction method to analyze the samples of low and trace elements is very difficult. Analysis of low and trace elements in the sample, most authors use the scattering internal standard method or adding internal standard method to correct the matrix effect.With the internal standard scattering method to determine the low and trace elements in the sample, the background intensity changes often The accuracy of the analysis results, in particular the analysis of the element’s proximity to the detection limit, the ability of the element to be detected and the accuracy of the measurement results depend largely on the magnitude of the background intensity and the accuracy of the background determination.