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[期刊论文] 作者：KANG Yi-lan,QIU Wei,LEI Zhen-k,
来源：光电子快报：英文版 年份：2007
在借助于 micro-Raman 光谱学的多孔的硅微观结构的剩余压力上的试验性的调查被介绍。它被与严肃的剩余压力在整个多孔的硅结构以内复杂地散布的不同的孔在电气化学的蚀刻的...
[期刊论文] 作者：KANG Yi-lan,QIU Wei,LEI Zhen-kun,
来源：城市道桥与防洪 年份：2007
该文从挂篮荷载计算、施工流程、支座及临时固结施工、挂篮安装及试验、合拢段施工、模板制作安装、钢筋安装、混凝土的浇筑及养生、测量监控等方面人手,介绍了S226海滨大桥...
[期刊论文] 作者：LEI Zhen-Kun,KANG Yi-Lan,CEN Hao,HU Ming,
来源：中国物理快报（英文版） 年份：2006
Porous silicon film is a capillary-like medium, which is able to reveal different meso-elastic modulus with porosity. During the preparation of porous silicon s...
[期刊论文] 作者：LEI Zhen-Kun,KANG YI-Lan,CEN Hao,HU Ming,QIU Yu,
来源：中国物理快报（英文版） 年份：2005
Surface and cross-sectional residual stresses of electrochemical etching porous silicon are investigated quantitatively by micro-Raman spectroscopy.The results...
,Experimental Study of Capillary Effect in Porous Silicon Using Micro-Raman Spectroscopy and X-Ray D
[期刊论文] 作者：LEI Zhen-Kun,KANG Yi-Lan,QIU Yu,HU Ming,CEN Hao,
来源：中国物理快报（英文版） 年份：2004
We investigate the capillary effect and the residual stress evolution in the wetting, drying and rewetting stages of porous silicon using x-ray diffraction and...
[期刊论文] 作者：QIU Wei,KANG Yi-Lan,LEI Zhen-Kun,QIN Qing-Hua,LI Qiu,
来源：中国物理快报（英文版） 年份：2009
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,An Experimental Analysis of Residual Stress Measurements in Porous Silicon Using Micro-Raman Spectr
[期刊论文] 作者：LEI Zhen-Kun,KANG Yi-Lan,HU Ming,QIU Yu,XU Han,NIU Hong-Pan,
来源：中国物理快报（英文版） 年份：2004
Micro-Raman spectroscopy of porous silicon films of micrometre thickness and on silicon bulk substrates is carried out. The practical information is given for a...
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