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[期刊论文] 作者：Xianglong Yang,Kun Yang,Yingxin Cui,Yan Peng,Xiufang Chen,Xuejian Xie,Xiaobo Hu,,
来源：Acta Metallurgica Sinica(English Letters) 年份：2014
The resistivities of vanadium-doped semi-insulating 4H-SiC wafers were measured by a contactless resistivity measurement system. Anomalous resistivity was found...
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