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Atomic force microscopy studies of SrTiO3 (001) substrates treated by chemical etching and annealing
The SrTiO3 (001) substrates treated by chemical etching in NH4F-buffered HF solution and annealing in oxygen ambient hav......
Extended defects in hydrogen-implanted (111) silicon wafer treated by high temperature annealing pro
High resolution transmission electron microscopy (HRTEM) has been used to investigate the extended defects induced by th......
介绍了东芝阀壳铸件(主汽阀MSV、调节阀CV)超声波探伤缺陷的主要波形特征和识别方法,阐述了具体应用的超声波探伤方法以及铸件中缺陷的定性......
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