TiPdNi thin films were prepared by magne tron sputtering onto unheated glass and silicon substrate. Atomic force microsc......

使用热分析和高温X射线研究了Ti50+xPd30Ni20-x合金相变温度的变化情况。发现当Ti的原子分数偏离50%时，合金的相变温度随Ti成分的升......