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IN-SITU TRANSMISSION ELECTRON MICROSCOPY TECHNIQUE AND ITS APPLICATIONS ON NANOCHARACTERIZATION

来源 :第十六届北京分析测试学术报告会 | 被引量 : 0次 | 上传用户：zhangfuliangez

【摘 要】

：

In-situ transmission electron microscopy(TEM) method is powerful in a way that it can directly correlate the atomic-scale structure with physical and chemical p

【作 者】

：

Xuedong Bai 

【机 构】

：

InstituteofPhysics,ChineseAcademyofSciences,Beijing100190,China

【出 处】

：

第十六届北京分析测试学术报告会

【发表日期】

：

2015年10期

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In-situ transmission electron microscopy(TEM) method is powerful in a way that it can directly correlate the atomic-scale structure with physical and chemical properties.

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