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由于突触在神经信号传递及可塑性研究中的重要地位,其亚显微结构的观察一直被认为是神经科学领域备受关注的研究问题。但是,至今仍然缺乏有效的研究手段来实现高分辨率的突触超微结构解析。近年来,随着电子显微镜技术突飞猛进的发展,使得对该问题的深入探讨成为可能。本文中,采用扫描透射电子断层扫描术对比较厚的脑片样本(<1μm)中突触的超微结构进行了观察,从三维水平上对突触复杂的内部精细结构进行探测,分析了突触囊泡的大小、形态、囊泡在突触前的分布及内体样囊泡的循环过程,为神经元突触功能研究提供了一种全新的方法和更为有效的手段。
Because of the importance of synapses in neuronal signaling and plasticity, the observation of sub-microstructures has long been considered as a research topic of great concern in neuroscience. However, there is still a lack of effective research methods to achieve high-resolution synaptic ultrastructure analysis. In recent years, with the rapid development of electron microscopy, making it possible to explore this issue in depth. In this paper, we observed the ultrastructure of synapses in the thicker brain slices (<1μm) by scanning transmission electron tomography, and probed into the complex structure of the synapses on the three-dimensional level, The size and morphology of the vesicles, the distribution of the vesicles before the synapse and the cycle of endosome-like vesicles provide a new method and a more effective method for the study of neuronal synaptic function.