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近年来对CCD的Y向过程已经开展了若干分析。如文献用解析方法讨论了刷扫的Y向过程。文献用图解法分析了Y向过程、特别是扫描重叠系数的影响。但是,在CCD刷扫中是否存在如一般行扫描仪中出现的重叠或漏扫现象,却在迄今的文献中尚无任何结论。并一直在刷扫中称参数e为扫描重叠次数或系数,甚至可能误认为同样有重叠或漏扫问题。本文将首先对此进行分析并加以澄清,从而可看到参数e在不同的扫描过程中有不同的物理含意。关于刷扫中Y向的空间分辨能力用图解法不能列举所有可能的e值与相位,因而本文
In recent years, the Y direction CCD process has carried out a number of analysis. As the literature discusses the Y-process of brushing with analytical methods. The literature uses graphical analysis of the Y-direction process, in particular the influence of scan overlay coefficients. However, there is no overlap or omission phenomenon in the CCD brushing which is common in the scanner. However, no conclusion has been reached in the literature to date. And has been brushing that the parameter e is the number of scanning overlap or coefficient, and may even be mistaken for the same overlap or drain problem. This article will first analyze this and clarify it so that it can be seen that parameter e has different physical implications in different scanning processes. The spatial resolution of the Y-direction in brushing can not be enumerated by the graphical method for all possible e-values and phases,