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讨论了电路在直流和脉冲直流工作情况下互连线的寿命 ,并重点考虑了工艺缺陷软故障的影响 ,提出了新的互连线寿命估计模型 .利用该模型可以估算出在考虑缺陷的影响时互连线的寿命变化情况 ,这对 IC电路设计有一定的指导作用 .模拟实验证明了该模型的有效性
The life span of the interconnection line under DC and pulsed DC operation is discussed, and the influence of the soft fault of the process defect is considered, a new interconnection life estimation model is proposed, which can be used to estimate the effect of considering the defect When the interconnection of the life of changes in the situation, which IC circuit design has a guiding role. Simulation experiments show the effectiveness of the model