论文部分内容阅读
本文提出了衍射分析用的X射线管谱线纯度的定量测定方法。在国产衍射仪上用石英单晶作分光晶体进行展谱测定。实验测得的各种波长X射线的强度应还原为X射线管窗口处的出射强度。对影响强度的各种因素作了详细的理论分析,给出了对应于不同靶、不同杂质元素的强度还原换算因子表。X射线管阳极靶元素主特征谱线强度用铜或铝吸收箔进行衰减,以避免计数损失造成的误差。用这一方法,对许多X射线管进行了测定。
This paper presents a quantitative method for the determination of the purity of X-ray tube spectra used in diffraction analysis. In the domestic diffractometer with quartz crystal for spectroscopic determination of spectrum. The experimentally measured intensities of various wavelength X-rays should be reduced to the exit intensities at the x-ray tube window. A detailed theoretical analysis of the various factors affecting the strength is given, and the table of intensity reduction conversion factors corresponding to different targets and different impurity elements is given. X-ray tube anode target element main characteristic line intensity attenuation with copper or aluminum absorption foil, in order to avoid errors caused by count loss. In this method, many X-ray tubes were measured.