SiO_3~(2-)枉酸性条件下与氟化钾作用生成K_2SiF_6沉淀,是氟硅酸钾容量法测定SiO_2的基础,它基于下列反应:随后将所得沉淀过滤洗涤,溶解于热水,以氢氧化钠标准溶液滴定水解所析出的氢氟酸的量,从而计算SiO_2的含量。我们设想,能否突破过去的路子,采用氟离子电极直接测定与SiO_3~(2-)作用的氟化钾的量,求出硅的含量?为此,我们对氟化钾沉淀SiO_3~(2-),然后用氟离子电极 The formation of K 2 SiF 6 precipitates by the action of potassium fluoride under acidic conditions of SiO 3 ~ (2-) is the basis for the determination of SiO 2 by potassium fluosilicate capacity. It is based on the following reaction: the resulting precipitate is filtered, washed, dissolved in hot water, Sodium oxide standard solution titration Hydrolysis of the amount of hydrofluoric acid precipitation, thereby calculating the content of SiO_2. We can imagine whether we can break through the path of the past and use fluoride ion electrode to directly measure the amount of potassium fluoride which interacts with SiO_3 ~ (2-) to get the content of silicon. Therefore, -), then use fluoride ion electrode