一、前言选区X射线微光束方法与常规的X射线多晶体平板照相法间的根本区别是这种方法使用直径为150微米以下的细X射线束照射试样。其次,试样上的照射面积通常限制在直径小于200微米。同时,还要按照实验者的希望选取指定的照射地点。从上述要求看,这种技术虽不过分复杂,可是要把选区精度做到显微尺度,这在实验技术上是相当困难的。本技术的价值在于它能获得试样上微小区域晶体结构的信息。这点恰恰是一般常规的X射线分析方法难于做到的。对研究某些实用材料局部区域的变形,例如裂纹尖端附近结构变化,以及热处理后材料局部性 I. Introduction The fundamental difference between the X-ray micro-beam method of selection and the conventional X-ray polycrystal plate method is that this method irradiates the sample with a fine X-ray beam having a diameter of 150 μm or less. Second, the exposure area on the sample is usually limited to less than 200 microns in diameter. At the same time, but also according to the experimenter’s hope to select the designated location of irradiation. Judging from the above requirements, this technique, though not overly complicated, should be microscopic in its accuracy. This is quite difficult experimentally. The value of this technique lies in its ability to obtain information on the crystalline structure of tiny areas of the specimen. This is precisely the general conventional X-ray analysis method is difficult to do. To study the deformation of some practical materials such as the structural changes near the crack tip and the material localization after heat treatment