通过实例分析,指出对于同一胚胎电子系统,当活动节点的数量一定时,活动节点阵列的行列结构不同会带来不同的可靠性;然后针对具有n×n阵列的胚胎电子系统,采用k-out-of-m可靠性模型,分别在行取消和细胞取消两种错误恢复策略下,从理论和实验上分析了不同行列结构对活动节点阵列可靠性的影响,并给出优化的活动节点阵列设计准则. Through case analysis, it is pointed out that for the same embryonic electronic system, when the number of active nodes is constant, different row and column structures of active node arrays will bring different reliability. Then for the embryonic electronic system with n × n array, k-out -of-m reliability model, respectively, under the two strategies of line cancellation and cell cancellation error recovery, theoretically and experimentally analyzed the influence of different ranks and structures on the reliability of the active node array, and gives an optimized active node array design Guidelines.