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采用三维时域有限差分法(FDTD),模拟计算了光子扫描隧道显微镜(PSTM)系统中的介质和银质金属样品在不同偏振模式光源下的近场强度分布。使用介质小样品检验探针性能,在探针不同位置计算得到了相似的近场强度分布图,说明编写的程序是可信的。给出了等高扫描时p偏振和s偏振条件下,“PSTM”字样介质样品和银质金属样品上方5nm处的近场强度分布图,结果显示:对介质样品,p偏振波能较好的反映样品的形貌,这是由入射电场的方向决定的;银质金属有表面增强作用,对不同偏振波均能在某种程度上反映样品的形貌,仍有待近一步的研究。
The three-dimensional finite difference time domain (FDTD) method was used to simulate the near-field intensity distribution of the medium and the silver metal sample in the photon-scanning tunneling microscope (PSTM) system under different polarization mode light sources. A small media sample was used to verify probe performance and a similar near-field intensity profile was calculated at various locations on the probe, demonstrating that the program was credible. The p-wave and p-polarized near-field intensity profiles at 5 nm above the “PSTM” sample and the silver metal sample at p-polarization and s-polarization are shown. The results show that the p- Reflect the shape of the sample, which is determined by the direction of the incident electric field; silver metal surface enhancement, for different polarized waves can reflect the morphology of the sample to some extent, remains to be further studied.