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本文叙述了测量红外折射率的简便方法,采用棱镜前表面自准直方法并且只要求:在改变光源波长或样品温度时,移动接收器来测量一条新偏向光线。包括也予考虑的抽真空样品空间和容器窗口楔的误差分析,表明能够获得的误差低至小数后4位为±1。我们已经研究出测量从1—30微米和在80—500K的透红外材料的折射率的简单而有效的技术,可以认为这种技术是最小偏向方法的改进。本文叙述了这种技术,设备和误差分析。此方法的主要优点是折射率能够比较容易地在广阔的光谱和温度范围内测出精度达小数点后4位,
This article describes a simple method of measuring infrared refractive index using a prism frontal self-collimation method and only requires that the receiver be moved to measure a new deflection beam when changing the wavelength of the light source or the sample temperature. Including also taking into account the vacuum sample space and container window wedge error analysis shows that the error can be obtained as low as 4 digits after the decimal ± 1. We have developed a simple and effective technique to measure the refractive index of infrared materials ranging from 1-30 microns and 80-500K, which can be considered an improvement of the least biased approach. This article describes this technique, equipment, and error analysis. The main advantage of this method is that the refractive index can be relatively easily measured in a wide range of spectral and temperature accuracy up to 4 decimal places,