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一、引言按照伟大领袖毛主席“洋为中用”的教导,几年来收集了国外有关半导体器件可靠性基本理论问题及试验方法,现整理写出。半导体器件自问世以来,是随着器件可靠性问题逐渐的解决,而不断发展起来的。根据国外有关资料和报导,经整理写出半导体器件稳定性及可靠性的重要性及其意义;简明介绍可靠性问题的几个基本概念,用概率论和数学统计的方法,对有关抽样的基本
I. INTRODUCTION According to the teaching of Chairman Mao Zedong, “Great Britain is a Medium Use,” a great leader has collected over the past several years the basic theoretical problems and test methods for the reliability of semiconductor devices abroad. Since the advent of semiconductor devices, with the device reliability issues gradually resolved, and continue to develop. According to the relevant foreign information and reports, the importance of the stability and reliability of semiconductor devices is stated and summarized. Some basic concepts of reliability problems are briefly introduced. Probability theory and mathematical statistics are used to analyze the basic