论文部分内容阅读
本文讨论高速双枪二极管阵列靶阴极射线管(CRT)扫描转换器用作瞬时信号捕捉部件和模拟/数字(A/D)转换器时,扫迹晕光和靶烧伤现象在扫迹速度低和/或写入枪束电流过大时产生的几种工作限制。文中叙述了三种靶型的晕光现象。并发现,要使扫迹晕光减小80％,必须以损失75％的书写灵敏度为代价。同时,对扫迹的残留现象(烧伤)也进行了分析。把10kV书写电子束使硅产生的X射线视为损伤的根源,其影响已由实验数据所验证,并确定了X射线的剂量。
This article discusses high-speed dual-gun diode array target cathode ray tube (CRT) scan converters for use as instantaneous signal capture components and analog / digital (A / D) converters. Or write gun beam current is too large when the resulting several kinds of work restrictions. The article describes the three types of target halo phenomenon. And found that to reduce stun rays by 80%, you have to sacrifice writing sensitivity by 75%. At the same time, the phenomenon of residual trace (burn) is also analyzed. The writing of electron beams at 10 kV causes the silicon-generated X-rays to be the source of damage, the effect of which has been verified by experimental data and the dose of X-rays has been determined.