论文部分内容阅读
鉴于常用的诊断方法(如微探针法,扫描电镜等)不适于测试和一些测试方法(如示波法,比较法等)不适于诊断,我们用简单易行而直观的光点阵列法兼作测试和诊断。叙述了点阵法的过程,探讨了点阵法诊断的原理、步骤、规律,使用全“0”、全“1”法,读写反,走步—踏步法诊断读写电路、存储单元和地址译码系统。定义了伪错码,绘制了伪错汇编图。提出了浮动座标系使系统简化,并进行了实验验证。对存储器的部份故障,初步收到了定量定位的效果。因此点阵法(可连用比较法)是对集成随机存取存储器兼作测试和诊断的一种简易、经济、有效的方法。
In view of the commonly used diagnostic methods (such as microprobe method, SEM, etc.) are not suitable for testing and some test methods (such as oscillometry, comparison method, etc.) is not suitable for diagnosis, we use a simple and intuitive light array Test and diagnosis. Describes the process of dot matrix method, explores the principle, steps and rules of dot matrix method, uses “0”, “1” method, read and write reverse, Address decoding system. Pseudo-error codes are defined and pseudo-assembly diagrams are drawn. A floating coordinate system is proposed to simplify the system and verify the experiment. Part of the memory failure, initially received the effect of quantitative positioning. Therefore, the dot matrix method (which can be used with comparison method) is a simple, economical and effective method for testing and diagnosing integrated random access memory.