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基于65nm标准CMOS工艺,提出了一种单次触发的动态D型触发器。基于这种D型触发器,设计了一种用于逐次逼近型(SAR)A/D转换器的高速移位寄存器。在传统的SAR A/D转换器转换过程中,比较器每比较1次,逻辑模块就进行1次移位和1次锁存,每1次移位延迟约为2个D触发器的工作时间,因此,限制了整个系统的转换速度。相比于传统的移位寄存器,本文设计的高速移位寄存器兼具移位和锁存的特点,仅需要传统结构一半数量的D触发器就能实现输出移位和锁存功能。这种寄存器结构能够将A/D转换器的转换速度提升45%,且功耗更小。
Based on 65nm standard CMOS technology, a single-shot dynamic D-type flip-flop is proposed. Based on this D-type flip-flop, a high-speed shift register for successive approximation (SAR) A / D converters is designed. In the traditional SAR A / D converter conversion process, the comparator for each comparison, the logic module to a shift and a latch, each shift delay of about 2 D flip-flop working hours , Thus limiting the overall system conversion speed. Compared with the traditional shift register, the high speed shift register designed in this paper has the characteristics of both shift and latch. Only half the number of D flip-flops in the conventional structure can achieve the output shift and latch functions. This register structure can A / D converter conversion speed by 45%, and power consumption is smaller.