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利用真空热蒸镀的方法制备了非晶Se薄膜 ,测试了稳定的非晶Se薄膜、不稳定的非晶Se薄膜和初始自发晶化的非晶Se薄膜的透射率光谱和拉曼光谱。对透射率光谱曲线进行了拟合 ,计算了薄膜的厚度和折射率随波长的变化关系。在自发晶化过程中 ,Se薄膜折射率逐渐增大 ;随波长增大 ,折射率则减小。初始自发晶化的Se薄膜其透射率低于非晶Se薄膜 ,光学吸收边向长波长方向移动。拉曼光谱测试表明 ,非晶Se薄膜在自发晶化过程中 ,出现标志Se8环和链的结构 ,不完整的环和链结构在自发晶化过程中得到了增强。
The amorphous Se films were prepared by vacuum thermal deposition. The transmittance spectra and Raman spectra of the amorphous films, unstable amorphous Se films and the initial spontaneous amorphous films were tested. The transmittance spectra were fitted and the thickness and refractive index of the films were calculated as a function of wavelength. During the spontaneous crystallization, the refractive index of the Se film gradually increases; as the wavelength increases, the refractive index decreases. The initial spontaneous crystallization of the Se film has a lower transmittance than that of the amorphous Se film, and the optical absorption edge moves in the long wavelength direction. Raman spectroscopy showed that during the process of spontaneous crystallization, the amorphous Se films showed the ring structure of Se8 and the chain structure. The incomplete ring and chain structure were enhanced during spontaneous crystallization.