本文提出一种评估电子产品可靠性的方法。它把电子产品定型前诸阶段不属于同一个母体的数据作为定型阶段补充数据。此方法有可能使定型试验所需的样品数大大节省,或者在同样样品数情况下,使给出的评估值更为可靠。本文所介绍的原理与方法不只适用于评估电子产品的平均寿命,也可用于精度及结构可靠性等指标的评定。 This article presents a method of evaluating the reliability of electronic products. It will be electronic products before the stage does not belong to the same parent data as a supplementary data set stage. This method may result in significant savings in the number of samples required for the setting test, or in the case of the same sample, to give a more reliable estimate. This article describes the principles and methods not only for the assessment of the average life expectancy of electronic products can also be used for accuracy and structural reliability and other indicators of assessment.